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| Total test solutions are provided from test
program development, test tool design, to production support.
These services cover chip probe and final test program development,
socket, probe card and load board test tool design, and program
transfer for production.
In-house testers are available since June 2006. It enhances
test engineering services and capabilities in both wafer level
and package level. |
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- CP/FT Test Program Development
- Test Patterns Conversion
- Test Tools Development ( PIB, DIB, Socket, Change Kit)
- Correlation between ATE and System
- Device Validation / Characterization
- Initial Production Support
- Transfer to mass production at sub-cons
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Agilent
93K Pin Scale
- 400MHz
- Up to 512 channels
- Up to 200/400/800 Mbps
- Vector Memory 32M
- Analog option(E-AV8)
- Audio ( 24bit/ 1M)
- Video ( 14bit/ 100M)
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Teradyne J750
- 100 MHz
- 384 I/O Channels
- 16M vector Memory
- MTO
- MSO
- CTO
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